CAL Test Electronics CT4076-NA Differential Probe 100:1/1000:1 35MHZ Grips & Support 25mm Cutting Edge Hardness 65°

25mm Cutting Edge Hardness 65° Product Range Lindstrom Series Other details

Type Diffusion Size 72 mm Density 2 density Effect Smoothes subject textures

Those things are nearly indestructible

15" Product Range - IP Rating - External Depth - Metric 258mm Enclosure Material ABS Other details

CAL Test Electronics CT4076-NA Differential Probe 100:1/1000:1 35MHZ Grips & Support 25mm Cutting Edge Hardness 65°This is a DIFFERENTIAL PROBE, 100: 1 1000: 1, 35MHZ product from CAL TEST ELECTRONICS with the model number CT4076 NAProduct details Oscilloscope Probe Function High Voltage Differential Probe Bandwidth 35MHz Input Voltage Max 7. 5kV Test Probe Attenuation 100: 1, 1000: 1 For Use With Oscilloscopes Product Range Other details Brand CAL TEST ELECTRONICS Part Number CT4076 NA Quantity Each Technical Data Sheet EN Operating Instructions EN All product